1. Cluster secondary ion mass spectrometry :
پدیدآورنده : edited by Christine M. Mahoney.
کتابخانه: Center and Library of Islamic Studies in European Languages (Qom)
موضوع : Secondary ion mass spectrometry.,Secondary electron emission.,Secondary ion mass spectrometry.,Surfaces (Physics)
رده :
QD96
.
S43
.
M34
2013
2. Desorption mass spectrometry :
پدیدآورنده : Philip A. Lyon, editor.
کتابخانه: Center and Library of Islamic Studies in European Languages (Qom)
موضوع : Field desorption mass spectrometry, Congresses.,Secondary ion mass spectrometry, Congresses.
رده :
QD96
.
M3
D47
1985
3. Desorption mass spectrometry : are SIMS and FAB the same?
پدیدآورنده :
کتابخانه: Central Library of Sharif University of Technology (Tehran)
موضوع : ، Field desorption mass spectrometry-- Congresses,، Secondary ion mass spectrometry-- Congresses
رده :
QD
96
.
M3
.
D47
1985
4. Ion Spectroscopies for surface analysis
پدیدآورنده : / Edited by A. W. Czanderna and David M. Hercules
کتابخانه: Central Library and Documents Center of Tehran University (Tehran)
موضوع : Solids -- Surfaces -- Analysis,Secondary ion mass spectrometry,Surface chemistry,surface chemistry
رده :
QC
176
.
8
.
S8I66
1991
5. Ion formation from organic solids )IFOS III( : mass spectrometry of involatile material : proceedings
پدیدآورنده : editor, A. Benninghoven
کتابخانه: Library of Institute for Research in Fundamental Sciences (Tehran)
موضوع : Congresses ، Secondary ion emission,Congresses ، Secondary ion mass spectrometry,Sepctra -- Congresses ، Organic compounds
رده :
QC
702
.
7
.
E4I57
1985
6. Ion formation from organic solids )IFOS III( : mass spectrometry of involatile material : proceedings of the third international conference, Munster, Fed. Rep. of Germany, September 16-18, 1985
پدیدآورنده : editor, A. Benninghoven
کتابخانه: Central Library and Documentation Center (Kerman)
موضوع : Congresses ، Secondary ion emission,Congresses ، Secondary ion mass spectrometry,Spectra - Congresses ، Organic compounds
رده :
QC
1
.
S672
v
.
9
7. Ion formation from organic solids : proceedings of the second international conference, Munster, Fed. Rep. of Germany, September 7-9, 1982
پدیدآورنده : editor, A. Benninghoven
کتابخانه: Central Library and Documentation Center (Kerman)
موضوع : Congresses ، Secondary ion emission,Congresses ، Secondary ion mass spectrometry,Spectra - Congresses ، Organic compounds,Congresses ، Field desorption mass spectrometry
رده :
QD
450
.
S65
v
.
25
8. Ion formation from organic solids : proceedings of the second international conference, Mغunster, Fed. Rep. of Germany, September 7-9, 1982
پدیدآورنده :
کتابخانه: Central Library of Sharif University of Technology (Tehran)
موضوع : ، Secondary ion emission-- Congresses,، Secondary ion mass spectrometry-- Congresses,، Organic compounds-- Spectra-- Congresses,، Field desorption mass spectrometry-- Congresses
رده :
QC
702
.
7
.
E4
.
I57
1983
9. Mass spectrometry
پدیدآورنده : K.Downard
کتابخانه: Central Library and Document Center of Shahid Madani University of Azarbayjan (East Azarbaijan)
موضوع : Field desorption mass spectrometry,Secondary ion mass spectrometry
رده :
QD
,
96
,.
D69
10. Seconary ion mass spectrometry: SIMS III: Proceedings of the third International Conference, Technical University, Budapest, Hungary, August 30-September 5, 1981
پدیدآورنده : editors, A. Benninghoven...]et al.[
کتابخانه: Central Library and Documentation Center (Kerman)
موضوع : Congresses ، Secondary ion mass spectrometry
رده :
QD
96
.
S43
S43
1981
11. Secondary ion mass spectromery SIMS V; Proceedings of the fifth intermational conference, Washington, DC. September 30- October 4, 1985
پدیدآورنده : editors: A. Benninghoven... ]et al.[
کتابخانه: Central Library and Documentation Center (Kerman)
موضوع : Congresses ، Secondary ion mass spectrometry
رده :
QD
450
.
S65
v
.
44
12. Secondary ion mass spectrometry
پدیدآورنده : / Paul van der Heide
کتابخانه: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
موضوع : Secondary ion mass spectrometry.
رده :
QD96
.
S43V36
2014
13. Secondary ion mass spectrometry :
پدیدآورنده : editors, A. Benninghoven [and others].
کتابخانه: Center and Library of Islamic Studies in European Languages (Qom)
موضوع : Secondary ion mass spectrometry -- Congresses.,Secondary ion mass spectrometry.
رده :
QD96
.
S43
E358
1986
14. Secondary ion mass spectrometry; SIMS III; proceedings of the Third International Conference Technical University, Budapest, Hungary, August 30 - September, 5, 1981
پدیدآورنده : editors A. Benninghoven... ]et.al.[
کتابخانه: Central Library and Documentation Center (Kerman)
موضوع : Congresses ، Secondary ion mass spectrometry
رده :
QD
450
.
S65
v
.
19
15. Secondary ion mass spectrometry in the earth sciences :
پدیدآورنده : edited by Mostafa Fayek.
کتابخانه: Center and Library of Islamic Studies in European Languages (Qom)
موضوع : Secondary ion mass spectrometry.
16. Secondary ion mass spectrometry in the earth sciences :
پدیدآورنده : edited by Mostafa Fayek.
کتابخانه: Center and Library of Islamic Studies in European Languages (Qom)
موضوع : Secondary ion mass spectrometry.
17. Secondary ion mass spectrometry: : principles and applications
پدیدآورنده : edited by John C. Vickerman, Alan Brown, and Nicola M. Reed
کتابخانه: Library of Niroo Research Institue (Tehran)
موضوع : ، Secondary ion mass spectrometry
رده :
QD
96
.
S43S4
1989
18. Secondary ion mass spectrometry : principles and applications
پدیدآورنده : edited by John C. Vickerman, Alan Brown, and Nicola M. Reed
کتابخانه: Central Library and Documents Center of Industrial University of Khaje Nasiredin Toosi (Tehran)
موضوع : ، Secondary ion mass spectrometry
رده :
QD
96
.
S43S4
19. Secondary ion mass spectrometry : principles and applications
پدیدآورنده : edited by John C. Vickerman, Alan Brown, and Nicola M. Reed
کتابخانه: Library of Institute of Biochemistry and Biophysics of University of Tehran (Tehran)
موضوع : Secondary ion mass spectrometry
رده :
QD
96
.
S43
S4
1989
20. Surface analysis of polymers by XPS and static SIMS /
پدیدآورنده : D. Briggs.
کتابخانه: Center and Library of Islamic Studies in European Languages (Qom)
موضوع : Polymers-- Surfaces-- Analysis.,Secondary ion mass spectrometry.,X-ray spectroscopy.,Polymères-- Surfaces-- Analyse.,Polymers-- Surfaces-- Analysis.,Secondary ion mass spectrometry.,Spectrométrie de masse des ions secondaires.,Spectroscopie des rayons X.,Spectroscopie photoélectrique.,X-ray spectroscopy.
رده :
QD381
.
9
.
S97
B75
1998
